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RIS citation export for TUPAB115: Impact of Electron Beam Heating on Insertion Devices at Diamond Light Source

TY - CONF
AU - Rial, E.C.M.
AU - Patel, Z.
ED - Schaa, Volker RW
ED - Arduini, Gianluigi
ED - Pranke, Juliana
ED - Seidel, Mike
ED - Lindroos, Mats
TI - Impact of Electron Beam Heating on Insertion Devices at Diamond Light Source
J2 - Proc. of IPAC2017, Copenhagen, Denmark, 14–19 May, 2017
C1 - Copenhagen, Denmark
T2 - International Particle Accelerator Conference
T3 - 8
LA - english
AB - Electron beam heating is a widely observed phenomenon at synchrotron facilities around the world, and has a large impact particularly on cryogenic insertion devices, but also on room temperature devices. This paper seeks to outline electron beam heating measurements taken at Diamond Light Source (DLS) and produces an empirical heat load relationship that matches the form of heating through the anomalous skin effect, although gives an order of magnitude higher than that predicted by theory. Resistive wall heating should vary inversely with the gap of installed cryogenic and permanent magnet insertion devices. This is also examined in this paper and the results presented.
PB - JACoW
CP - Geneva, Switzerland
SP - 1588
EP - 1591
KW - electron
KW - wiggler
KW - cryogenics
KW - insertion-device
KW - insertion
DA - 2017/05
PY - 2017
SN - 978-3-95450-182-3
DO - 10.18429/JACoW-IPAC2017-TUPAB115
UR - http://jacow.org/ipac2017/papers/tupab115.pdf
ER -