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https://doi.org/10.18429/JACoW-IPAC2021-WEPAB270
Title Characterization and Simulation of Optical Delay System for the Proof-of-Principle Experiment of Optical Stochastic Cooling at IOTA
Authors
  • A.J. Dick, P. Piot
    Northern Illinois University, DeKalb, Illinois, USA
  • J.D. Jarvis
    Fermilab, Batavia, Illinois, USA
  • P. Piot
    ANL, Lemont, Illinois, USA
Abstract The Optical Stochastic Cooling (OSC) experiment at Fermilab’s IOTA storage ring uses two undulators to cool the beam over many turns. The radiation emitted by electrons in the first undulator is delayed and imaged in the second undulator where it applies a corrective energy kick on the electrons. Imperfections in the manufacturing of the delay plates can lead to a source of error. This paper presents the experimental characterization of the absolute thickness of these delay plates using an interferometric technique. The measured "thickness maps" are implemented in the Synchrotron Radiation Workshop (SRW) program to assess their impact on the delayed radiation pulse.
Funding CBB NSF-PHY-1549132 DOE DE-SC0018656 DOE DE-AC02-07CH11359
Paper download WEPAB270.PDF [1.880 MB / 4 pages]
Poster download WEPAB270_POSTER.PDF [2.578 MB]
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Conference IPAC2021
Series International Particle Accelerator Conference (12th)
Location Campinas, SP, Brazil
Date 24-28 May 2021
Publisher JACoW Publishing, Geneva, Switzerland
Editorial Board Liu Lin (LNLS, Campinas, Brazil); John M. Byrd (ANL, Lemont, IL, USA); Regis Neuenschwander (LNLS, Campinas, Brazil); Renan Picoreti (LNLS, Campinas, Brazil); Volker R. W. Schaa (GSI, Darmstadt, Germany)
Online ISBN 978-3-95450-214-1
Online ISSN 2673-5490
Received 16 May 2021
Accepted 05 July 2021
Issue Date 22 August 2021
DOI doi:10.18429/JACoW-IPAC2021-WEPAB270
Pages 3269-3272
Copyright
Creative Commons CC logoPublished by JACoW Publishing under the terms of the Creative Commons Attribution 3.0 International license. Any further distribution of this work must maintain attribution to the author(s), the published article's title, publisher, and DOI.